Celebrating the Successful Installation of CIQTEK SEM5000X at GSEM in Korea

Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM)   The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.

Analytical Schottky Field Emission Scanning Electron Microscope (FESEM)   CIQTEK SEM4000Pro is an analytical FE-SEM model equipped with a high-brightness and long-life Schottky field emission electron gun. Its three-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. The model comes standard with a low-vacuum mode and high-performance low-vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.  

High-performance and Universal Tungsten Filament SEM Microscope   The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.