The CIQTEK SEM3200 is a high-performance tungsten filament scanning electron microscope, designed for those who demand excellence in imaging. It delivers exceptional image quality with high-resolution visuals and an expansive depth of field, ensuring rich detail and dimension in every image.
SEM3200 also offers a low vacuum mode, allowing for the direct observation of non-conductive samples without the need for coating. Its extended scalability makes it compatible with various detectors and tools, including SE, BSE, EDS, and EBSD.
For scientists, the SEM3200 provides numerous benefits:
· High-resolution imaging: Achieve stunning clarity and detail.
· Versatility: Flexible sample positioning with a five-axis eucentric stage.
· Scalability: Seamlessly integrate additional detectors and analytical tools to extend functionality.
· User-friendly interface: Simplifies complex imaging tasks, enhancing productivity and research outcomes.
These features empower researchers to push the boundaries of their work, from material science to biological studies.
High-performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.
Next-generation Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
120kV Field Emission Transmission Electron Microscope (TEM) 1. Divided Workspaces: Users operate TEM in a divided room with comfort reducing environmental interference to TEM. 2. High Operational Efficiency: Designated software integrates highly automated processes, allowing efficient TEM interaction with real-time monitoring. 3. Upgraded Operational Experience: Equipped with a field emission electron gun with a highly automated system. 4. High Expandability: There are sufficient interfaces reserved for users to upgrade to a higher configuration, which meets diverse application requirements.