CIQTEK Partners with JH Technologies as Regional Distributor throughout North America for Electron Microscopes
CIQTEK Partners with JH Technologies as Regional Distributor throughout North America for Electron Microscopes
January 09, 2025
CIQTEK, a leading manufacturer in the field of optical and electron microscopy, has recently entered into a strategic partnership with JH Technologies, a renowned distributor in North America. This collaboration aims to focus on providing cutting-edge scanning electron microscopes (SEMs)to customers across the region while enhancing the profile of CIQTEK.
With 37 years of extensive experience delivering microscopy and optical solutions, CIQTEK ensures that JH Technologies can offer high-resolution SEMs and peripheral equipment to meet the diverse needs of its customers. This partnership enables JH Technologies to expand its offerings and provide comprehensive solutions throughout the SEM workflow, including TEMs(transmission electron microscopes) andFIBs(focused ion beam systems).
John Hubacz, the CEO of JH Technologies, expressed enthusiasm about the new venture, stating that CIQTEK's SEM, TEM, and FIBoffer unparalleled resolution, unique technologies, and impressive return on investment (ROI). The combination of JH Technologies' existing product lines and analytical lab and the inclusion of CIQTEK's cutting-edge products positions them as a leader in delivering value-added solutions throughout the SEM workflow.
Aleks Zhang, the Director of Overseas Marketing for CIQTEK, also expressed excitement about partnering with a reputable and experienced company like JH Technologies. Zhang commended JH Technologies for their knowledgeable sales staff, understanding of the market, skilled service team, and impressive showroom, which make them the ideal partner to expand CIQTEK's business in North America.
CIQTEKis dedicated to providing customized products and application solutions in various scientific disciplines, including environmental science, biochemistry, chip semiconductors, and materials science. Their product range includes scanning electron microscopes (SEMs), electron paramagnetic resonance spectroscopy, scanning NV probe microscopes, and BET surface area and pore analyzers. With over 700 employees, including a significant R&D and engineering team, CIQTEK is committed to innovation, increasing productivity, and delivering excellent customer service through its 12 application centers.
Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.
Ultra-high Resolution Field Emission Scanning Electron Microscopy (FESEM) Challenges the Limits The CIQTEK SEM5000X is an ultra-high resolution FESEM with optimized electron optics column design, reducing overall aberrations by 30%, achieving ultra-high resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Its high resolution and stability make it advantageous in advanced nano-structural materials research, as well as the development and manufacturing of high-technology node semiconductor IC chips.
High-performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.