TEM+FIB! CIQTEK Received High Recognition From the Experts Present on CEMS

The National Conference on Electron Microscopy(CEMS) was held in Dongguan from October 17th to 21st, 2024. The conference attracted nearly 2,000 experts, scholars, and representatives from universities, research institutions, enterprises, and instrument technology companies.

CIQTEK showcased the Focused Ion Beam Scanning Electron Microscope DB550 and the Field Emission Transmission Electron Microscope TH-F120 and conducted live demonstrations on-site, which received wide attention from the attendees.

"Next-Generation On-axis Signal Electron Selective Detection Technology & Progress

in Cold FEG Scanning Electron Microscope Development"

Mr. Cao Feng, Vice President of CIQTEK, delivered a keynote speech during the conference, showcasing the company's latest technological breakthroughs and innovative achievements in the field of electron microscopy, and receiving high recognition from the experts present.

To provide users with a tangible experience of the development achievements of high-end electron microscopes and to demonstrate the real performance of the products, CIQTEK once again set up the "Electron Microscope Laboratory" at the conference venue.

With careful arrangement by a professional team, the booth not only recreated a laboratory environment but also realized the live demonstration of the Focused Ion Beam Scanning Electron Microscope DB550 and the Field Emission Transmission Electron Microscope TH-F120. On-site sample preparation and imaging fully showcased the superior performance of domestically produced high-end electron microscopes, attracting a large number of professional visitors for visit exchanges.