Successful Installation of CIQTEK's SEM3200 and SEM4000Pro at the GSEM Testing Center in Korea
Successful Installation of CIQTEK's SEM3200 and SEM4000Pro at the GSEM Testing Center in Korea
August 26, 2024
Suwon, Korea - In a significant development, leading scientific equipment distributor GSEM Korea has successfully installed cutting-edge SEM3200 and SEM4000Pro Scanning Electron Microscope (SEM)at its testing center in Korea.
The SEM3200 and SEM4000Pro SEM Microscopeof CIQTEKrepresent a breakthrough in modern high-resolution imaging. With advanced electron microscopy technology,these cutting-edge SEM Microscopeswill provide exceptional tools and platforms for Korean researchers and industry professionals, driving advancements in variousfields.
"We are thrilled with the installationof the SEM3200 and SEM4000Pro," saida research scientist at GSEM. "The high resolution and advanced imaging capabilities allow us to gain valuable insights intomicroscopicanalysis, enabling us to optimize and tailor their performance for specific applications. "
With an extensive sales network and a dedicated team of technical experts, GSEMremains committed to fostering scientific innovation and progress, providing excellent instrumentation, and delivering technical support for researchers and industry professionals in Korea. They collaborate with businesses and research institutions to drive the development of scientific research, making significant contributions to Korea's innovation and sustainable growth.
Analytical Field Emission Scanning Electron Microscope (FESEM) with Large Beam I CIQTEK SEM4000Pro is an analytical model of FE-SEM, equipped with a high-brightness and long-life Schottky field emission electron gun. The 3-stage electromagnetic lens design offers significant advantages in analytical applications such as EDS / EDX, EBSD, WDS, and more. It comes standard with a low vacuum mode and high-performance low vacuum secondary electron detector, as well as a retractable backscattered electron detector, which benefits the observation of poorly conductive or non-conductive specimens.
High-performance and Universal Tungsten Filament SEM Microscope The CIQTEK SEM3200 SEM Microscope is an excellent general-purpose Tungsten Filament Scanning Electron Microscope (SEM) with outstanding overall capabilities. Its unique Dual-anode electron gun structure ensures high resolution and improves image signal-to-noise ratio at low excitation voltages. Furthermore, it offers a wide range of optional accessories, making the SEM3200 a versatile analytical instrument with excellent expendabilities.
Next-generation Tungsten Filament Scanning Electron Microscope The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies to the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
120kV Field Emission Transmission Electron Microscope (TEM) 1. Divided Workspaces: Users operate TEM in a divided room with comfort reducing environmental interference to TEM. 2. High Operational Efficiency: Designated software integrates highly automated processes, allowing efficient TEM interaction with real-time monitoring. 3. Upgraded Operational Experience: Equipped with a field emission electron gun with a highly automated system. 4. High Expandability: There are sufficient interfaces reserved for users to upgrade to a higher configuration, which meets diverse application requirements.