Exploring Precision Measurement - Interviewed by Xinhua News Agency

Recently, CIQTEK was invited by Xinhua News Agency to record a video interview on "Exploring Precision Measurement". CIQTEK is very honored and happy to have this opportunity to spread this technology and information to the public. 

In the interview, Frank Chen, Overseas Business Development Manager, CIQTEK, demonstrated and introduced the self-developed precision measurement instruments such as the Scanning NV Microscope (SNVM) and Electron Paramagnetic Resonance (EPR or ESR) spectrometer.

The following is from Xinhua News Agency (or check the news here): 

"A precision measurement instrument called Scanning NV Microscope can achieve nanoscale high spatial resolution and single spin ultra-high detection sensitivity. Explore more about it with a Bangladeshi PhD student in China's Anhui.

Produced by Xinhua Global Service "