CIQTEK Scanning NV Microscope (SNVM) at China Scanning Probe Microscopy Symposium 2019

From September 27th to 28th, the "China Scanning Probe Microscopy Symposium (SPM2019)" hosted by Anhui General University Key Laboratory of Precision Scientific Instruments, and co-organized by CIQTEK was held in the Expert Building in Hefei, Anhui, China.

Group Photo of SPM2019

From the 1990s to 2012, the China SPM Symposium has been successfully held for twelve sessions, playing an important role in the progress of science and technology and the development of high-tech industries.

At the opening ceremony of the conference, Vice President Luo Xisheng talked about the development history and status of scanning probe microscopy. He also emphasized the original purpose and importance of this conference, hoping to promote communication and exchange between experts and scholars through this conference, and wished the conference a complete success.

SPM2019 Site

Experts and scholars from well-known universities and research institutions such as Peking University and the Chinese University of Hong Kong, as well as many global scanning probe microscope instrument developers, gathered to conduct academic exchanges on SPM scientific research results and industrialization development.

The conference provided a platform for academic exchange. The attending experts shared their academic achievements in the field of SPM in recent years and discussed the new trends in the future development of SPM together. During the conference, 14 invited presentations, 17 oral presentations, and 2 enterprise presentations were made by experts and scholars on five topics, including "SPM-related fundamental theories and simulation methods", "SPM instrumentation technology progress", "SPM important applications", "SPM standardization" and "product promotion of domestic and foreign SPM manufacturers".

CIQTEK CEO Dr. Yu He made the report

As a co-organizer of the conference and a developer of scientific instruments related to SPM, Dr. Yu He, CEO of CIQTEK, attended the conference and gave a presentation on "Development and Engineering of Scanning NV Microscope (SNVM)". 

CIQTEK also brought its Scanning NV Microscope to the exhibition site of this conference and made a comprehensive introduction and demonstration to the participants.

Li Bingjiang, director of CIQTEK marketing department, introduced the Scanning NV Microscope (SNVM) on site

CIQTEK Scanning NV Microscope (SNVM)

CIQTEK SNVM is a scanning NV center microscope based on diamond nitrogen-vacancy center (NV center) and AFM scanning imaging technology. The magnetic properties of the sample are obtained quantitatively and non-destructively by control and readout of the spin state in the diamond probe. Based on the NV diamond magnetometry and mechanics, SNVM has nanoscale spatial resolution and ultra-high detection sensitivity and can be used to develop and study magnetic textures, high-density magnetic storage, and spintronics. 

There are two versions: the ambient version and the cryogenic version.

CIQTEK Scanning NV Microscope (SNVM)