CIQTEK Continues Shipping Success: Delivering High-End Electron Microscopes to Over 40 Countries Worldwide
CIQTEK Continues Shipping Success: Delivering High-End Electron Microscopes to Over 40 Countries Worldwide
November 28, 2024
November 2024 - CIQTEK, a leading manufacturer in high-end scientific instrument research and development, proudly announces another successful round of shipments. As of November this year, the company has delivered its latest range of Electron Microscopeproducts to more than 40 countries worldwide.
The international customers have expressed unanimous satisfaction with the performance and quality of CIQTEK's offerings, further solidifying their reputation as a trusted provider in the field.
CIQTEK's commitment to excellence is evident in its unwavering dedication to serving researchers across various disciplines. With a strong focus on innovation and advanced technology, the company strives to meet the evolving demands of scientists and professionals in diverse application areas.
The global reach of CIQTEK's shipments extends to major regions in Europe, the Americas, Asia, etc. From prestigious research institutions to cutting-edge laboratories, CIQTEK's Electron Microscopehas become an indispensable tool for scientists and researchers worldwide.
"Our success in delivering Electron Microscopesto such a wide range of countries is a testament to our commitment to excellence and customer satisfaction," said Branco, Overseas Sales Regional Director at CIQTEK. "We are privileged to be the instrument of choice for researchers seeking to push the boundaries of knowledge in their respective fields."
CIQTEK's continuous efforts to innovate and refine its products have positioned it as a trusted partner in scientific exploration. The company's ongoing dedication to exceptional service and support ensures that researchers can rely on CIQTEK as they embark on groundbreaking discoveries.
Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities. The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.