Scanning Electron Microscopy (SEM) is a microscopy technique that uses a focused electron beam to create detailed images of the surface of a sample. The electron beam scans the sample in a raster pattern, and the resulting signals generated by interactions between the electron beam and the sample's surface are detected and used to form an image. SEM provides high-resolution three-dimensional surfa...
Microscopy has revolutionized our understanding of the microscopic world, enabling scientists to reveal complex structures and study materials at the nanoscale. Among the various powerful microscopes, the scanning electron microscope (SEM) is an indispensable tool for imaging surfaces with extraordinary detail and resolution. In this blog post, we will look in-depth at different types of scanning ...