The CIQTEK Widefield NV Microscope is a wide-field magnetic microscope based on the principle of Nitrogen-Vacancy (NV) Optically Detected Magnetic Resonance (ODMR), which has the features of high spatial resolution, large field of view, large dynamic range of detectable magnetic field, and fast imaging speed.
It's compatible with ambient testing environments to cryogenic & vacuum extreme environments.
Geomagnetism
The strength of residual magnetization in geological samples records the strength and direction of past planetary magnetic fields. Traditionally, this magnetization is analyzed by measuring the net magnetic moment of samples with dimensions in the millimeter to centimeter range. However, geological samples are typically structurally and materially inhomogeneous at sub-millimeter sizes, and only a small fraction of ferromagnetic particles have residual magnetization strengths, thus requiring imaging techniques with high spatial resolution and high magnetic moment sensitivity.d only a small fraction of ferromagnetic particles carry magnetism.
The CIQTEK Widefield NV Microscopy is capable of detecting magnetic moments with a sensitivity of 10-16 A·m2 by reducing the distance between the diamond and the sample. It can be applied to the detection and analysis of geological and magnetic meteorites.
References: Geochem. Geophys. Geosyst 18, 3254 (2017)
Biomedical
Conventional magnetic resonance imaging is limited by low sensitivity and low spatial resolution, which makes it difficult to apply to imaging with micrometer resolution at the tissue level. Wide-field NV microscope combines quantum precision measurement and immunomagnetic labeling technology to achieve high-resolution magnetic imaging of tumor tissues, which can be used for the detection of lung cancer and so on.
The CIQTEK Widefield NV Microscopy has the advantages of absolute magnetic quantification, avoiding the interference of background signals, high stability of magnetic signals, and both magnetic and optical multimodal imaging in biological tissue imaging.
References: PNAS 119, e2118876119 (2022)
Chip Detection
As the semiconductor industry grows, chips are becoming more complex, containing more transistors and multilayer integrated circuits, which complicates failure analysis. Wide-field NV microscopy can be used to analyze 2D and 3D current distribution detection in integrated circuits (ICs) and multilayer printed circuit boards (PCBs).
The CIQTEK Wide-field NV Microscopy can also be used to detect hardware Trojans in ICs and, in combination with neural network learning methods, can accurately determine the presence or absence of inserted Trojans at each data point.
References: Phys. Rev. Appl. 14, 014097 (2020)