scanning electron microscope market

Tungsten Filament SEM | SEM3300

Next-generation Tungsten Filament Scanning Electron Microscope

 

The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies into the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.

 In-lens Electron Detector

  • SEM In-lens Electron Detector
  • SEM3300 analysis images

    lmages of lithium battery diaphragm taken at 1 kV with a magnification of 20,000 times on film, images taken with SEM3300

  •  

 


Auto Functions for Efficient Working

lmproved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!

>> Automatic Focus

  • during autofocus
  • after autofocus

 

>> Automatic Astigmatism Correction

  • during autofocus
  • after autofocus

 

>> Automatic Brightness & Contrast

  • during autofocus
  • after autofocus

 

>> AutoMap *optional

  • during autofocus

Safer to Use


Easy Filament Replacement

Pre-aligned replacement filament module ready to use.

 

CIQTEK SEM Microscope SEM3300 Image Gallery


Particle & Pore Analysis Software (Particle) *Optional

SEM Particle & Pore Analysis Software (Particle)

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.


Image Post-processing Software

SEM Microscope Image Post-processing Software

Perform online or offline image post-processing on images captured by electron microscopes and integrates commonly used EM image processing functions, convenient measurement andannotation tools.


Auto Measure *Optional

SEM Microscope software Auto Measure

Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.


Software Development Kit (SDK) *Optional

SEM Microscope Software Development Kit (SDK)

Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.

 

CIQTEK SEM3300 SEM Microscope
Electron Optics Resolution 2.5 nm @ 15 kV, SE
4 nm @ 3 kV, SE
5 nm @ 1 kV, SE
Accelerating Voltage 0.1 kV ~ 30 kV
Magnification (Polaroid) 1 x ~ 300,000 x
Specimen Chamber Low Vacuum None
Camera Optical Navigation
Chamber Monitoring
Stage Type 5-Axis Vacuum Compatible Motorized
XY Range 125 mm
Z Range 50 mm
T Range - 10° ~ 90°
R Range 360°
SEM Detectors Standard In-lens Electron Detector (Inlens)
Everhart-Thornley Detector (ETD)
Optional Retractable Back-Scattered Electron Detector (BSED)
Energy Dispersive Spectrometer (EDS)
Electron Backscattered Diffraction Pattern (EBSD)
Optional Specimen Exchange Loadlock
Trackball & Knob Control Panel
User Interface Operating System Windows
Navigation Optical Navigation, Gesture Quick Navigation, Trackball (Optional)
Automatic Functions Auto Brightness & Contrast, Auto Focus, Automatic Stigmator
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