Tungsten Filament SEM | SEM3300 suppliers,Tungsten Filament SEM | SEM3300 manufacturers,Tungsten Filament SEM

Break Through the Resolution Limit of Tungsten Filament SEMs
In-lens Electron Detector
Electromagnetic & Electrostatic Combo Objective Lens

Safer to Use
Excellent Expandability

▶ In-lens Electron Detector

Images of lithium battery diaphragm taken at 1 kV with a magnification of 20,000 times on film, images taken with SEM3300

▶ Optical Navigation

Using a vertically mounted chamber camera to capture optical images for specimen stage navigation allows for a more intuitive and accurate specimen positioning.

▶ Auto Functions

Improved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!

>> Automatic Focus

>> Automatic Astigmatism Correction

>> Automatic Brightness & Contrast

▶ Safer to Use

Infrared CCD
Real-time chamber interior motion monitoring using image recognition and motion capture technology.
Anti-collision (Software)
Manually input the sample height to accurately define the distance between the sample and the objective lens to prevent collisions.
Anti-collision (Hardware)
Shut off the power to the stage motor at the moment of collision to minimize damage.

▶ Easy Filament Replacement

Pre-aligned replacement filament module ready to use.

CIQTEK SEM Microscope SEM3300 Image Gallery

Nickel Mesh, 5 kV / ETD
Solar Cell, 3 kV / ETD

▶ Particle & Pore Analysis Software (Particle) *Optional

SEM Particle & Pore Analysis Software (Particle)

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

▶ Image Post-processing Software

Perform online or offline image post-processing on images captured by electron microscopes and integrate commonly used EM image processing functions, convenient measurement, and annotation tools.

▶ Auto Measure *Optional

Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.

▶ Software Development Kit (SDK) *Optional

SEM Microscope Software Development Kit (SDK)

Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.

▶ AutoMap *Optional

CIQTEK SEM3300 SEM Microscope Specifications
Electron Optics	Resolution	2.5 nm @ 15 kV, SE 4 nm @ 3 kV, SE 5 nm @ 1 kV, SE



	Accelerating Voltage	0.1 kV ~ 30 kV
	Magnification (Polaroid)	1 x ~ 300,000 x
Specimen Chamber	Camera	Optical Navigation

		Chamber Monitoring
	Stage Type	5-Axis Vacuum Compatible Motorized
	XY Range	125 mm
	Z Range	50 mm
	T Range	- 10° ~ 90°
	R Range	360°
SEM Detectors	Standard	In-lens Electron Detector (Inlens) Everhart-Thornley Detector (ETD)
	Optional	Retractable Back-Scattered Electron Detector (BSED) Energy Dispersive Spectrometer (EDS / EDX) Electron Backscattered Diffraction Pattern (EBSD)
Optional	Specimen Exchange Loadlock

	Trackball & Knob Control Panel
User Interface	Operating System	Windows
	Navigation	Optical Navigation, Gesture Quick Navigation, Trackball (Optional)
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Automatic Stigmator

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