Next-generation Tungsten Filament Scanning Electron Microscope
The CIQTEK SEM3300 scanning electron microscope (SEM) incorporates technologies such as "Super-Tunnel" electron optics, inlens electron detectors, and electrostatic & electromagnetic compound objective lens. By applying these technologies into the tungsten filament microscope, the long-standing resolution limit of such SEM is surpassed, enabling the tungsten filament SEM to perform low-voltage analysis tasks previously only achievable with field emission SEMs.
lmproved Automatic Brightness & Contrast, Automatic Focus, and Automatic Astigmatism Correction Functions. Imaging by a single click!
Pre-aligned replacement filament module ready to use.
The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.
Perform online or offline image post-processing on images captured by electron microscopes and integrates commonly used EM image processing functions, convenient measurement andannotation tools.
Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.
Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.
CIQTEK SEM3300 SEM Microscope | ||||
Electron Optics | Resolution | 2.5 nm @ 15 kV, SE 4 nm @ 3 kV, SE 5 nm @ 1 kV, SE |
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Accelerating Voltage | 0.1 kV ~ 30 kV | |||
Magnification (Polaroid) | 1 x ~ 300,000 x | |||
Specimen Chamber | Low Vacuum | None | ||
Camera | Optical Navigation | |||
Chamber Monitoring | ||||
Stage Type | 5-Axis Vacuum Compatible Motorized | |||
XY Range | 125 mm | |||
Z Range | 50 mm | |||
T Range | - 10° ~ 90° | |||
R Range | 360° | |||
SEM Detectors | Standard | In-lens Electron Detector (Inlens) Everhart-Thornley Detector (ETD) |
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Optional | Retractable Back-Scattered Electron Detector (BSED) Energy Dispersive Spectrometer (EDS) Electron Backscattered Diffraction Pattern (EBSD) |
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Optional | Specimen Exchange Loadlock | |||
Trackball & Knob Control Panel | ||||
User Interface | Operating System | Windows | ||
Navigation | Optical Navigation, Gesture Quick Navigation, Trackball (Optional) | |||
Automatic Functions | Auto Brightness & Contrast, Auto Focus, Automatic Stigmator |