Applications

Metal materials play an indispensable role in modern industry, and their performance directly affects product quality and service life. With the continuous development of materials science, higher requirements have been put forward for the microscopic structure and composition analysis of metal materials. As an advanced characterization tool, Scanning Electron Microscope (SEM) can provide high-resolution surface morphology information and combine with spectroscopic analysis techniques for elemental composition determination, making it an important tool in metal material research. This article aims to discuss the application of SEM technology in the characterization of metal materials and provide references and guidance for related research.   Basic Principles of Scanning Electron Microscope (SEM) The working principle of a scanning electron microscope is based on the interaction between an electron beam and the sample surface. When a high-energy electron beam scans the sample surface, various signals are generated, including secondary electrons, backscattered electrons, characteristic X-rays, etc. These signals are collected by corresponding detectors and processed to form surface morphology images or elemental distribution maps of the sample.   SEM Sample Preparation for Metal Materials   Microstructural Analysis: CIQTEK SEM provides high-resolution images to help researchers observe and analyze the microstructure of metals and composite materials, such as grain size, shape, phase distribution, and defects (e.g., cracks, and inclusions). This is crucial for understanding the relationship between material properties and processing techniques.   α ＋ β Titanium Alloy The heat-affected zone is the most vulnerable area in a welded joint. Studying the changes in the microstructure and properties of the welded area are of great significance for solving welding issues and improving welding quality.   Composition Analysis: Equipped with an EDS or a WDS system, CIQTEK SEM allows for qualitative and quantitative elemental composition analysis. This is highly important for studying the distribution patterns of alloying elements and their impact on material properties.   Elemental Line Analysis by EDS By combining SEM with EDS analysis, the compositional changes and    element distribution of impurities in the welding area can be observed.   Failure Analysis: After failures such as fractures, corrosion, or other forms of damage occur in metals and composite materials, CIQTEK SEM is a key tool for analyzing mechanism failure. By examining fracture surfaces, corrosion products, etc., the root cause of the failure can be identified, providing insights for improving material reliability and lifespan.   2A12 Failure of aluminum alloy components 2A12 aluminum alloy exhibits various precipitation phases, which can be distinguished morphologically as        ...

CIQTEK FIB-SEM Practical Demonstration Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication, maskless processing, nanostructure fabrication, complex nano-patterning, three-dimensional imaging and analysis of materials, ultra-sensitive surface analysis, surface modification, and transmission electron microscopy specimen preparation.   CIQTEK has introduced the FIB-SEM DB550, which features an independently controllable Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns. It is an elegant and versatile nanoscale analysis and specimen preparation tool, that adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly stable, high-quality ion beam to ensure nano-fabrication capability. DB550 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and user-friendly GUI software, facilitating an all-in-one nanoscale analysis and fabrication workstation.   To showcase the outstanding performance of the DB550, CIQTEK has planned a special event called "CIQTEK FIB-SEM Practical Demonstration." This program will present videos demonstrating the broad applications of this cutting-edge equipment in fields such as materials science, the semiconductor industry, and biomedical research. Viewers will gain an understanding of the working principles of the DB550, appreciate its stunning microscale images, and explore the significant implications of this technology for scientific research and industrial development.   Nano-Micropillar Specimen Preparation  Nano-micropillar Specimen Preparation has been successfully achieved, demonstrating the powerful capabilities of CIQTEK Focused Ion Beam Scanning Electron Microscope in nanoscale processing and analysis. The product's performance provides precise, efficient, and multimodal testing support for customers engaged in nanomechanical testing, facilitating breakthroughs in materials research.  

CIQTEK FIB-SEM Practical Demonstration Focused Ion Beam Scanning Electron Microscope (FIB-SEM) are essential for various applications such as defect diagnosis, repair, ion implantation, in-situ processing, mask repair, etching, integrated circuit design modification, chip device fabrication, maskless processing, nanostructure fabrication, complex nano-patterning, three-dimensional imaging and analysis of materials, ultra-sensitive surface analysis, surface modification, and transmission electron microscopy specimen preparation.   CIQTEK has introduced the FIB-SEM DB550, which features an independently controllable Field Emission Scanning Electron Microscope (FE-SEM) with Focused Ion Beam (FIB) Columns. It is an elegant and versatile nanoscale analysis and specimen preparation tool, that adopts “SuperTunnel” electron optics technology, low aberration, and non-magnetic objective design with low voltage and high-resolution capability to ensure the nano-scale analysis. The ion column facilitates a Ga+ liquid metal ion source with a highly stable, high-quality ion beam to ensure nano-fabrication capability. DB550 has an integrated nano-manipulator, gas injection system, electrical anti-contamination mechanism for the objective lens, and user-friendly GUI software, which facilitates an all-in-one nanoscale analysis and fabrication workstation.   To showcase the outstanding performance of the DB550, CIQTEK has planned a special event called "CIQTEK FIB-SEM Practical Demonstration." This program will present videos demonstrating the broad applications of this cutting-edge equipment in fields such as materials science, the semiconductor industry, and biomedical research. Viewers will gain an understanding of the working principles of the DB550, appreciate its stunning microscale images, and explore the significant implications of this technology for scientific research and industrial development.   Preparation of a transmission specimen of Ferrite-martensite steel   The FIB-SEM DB550 developed by CIQTEK possesses the capability to prepare transmission specimens of ferrite-martensite steel flawlessly. This capability enables researchers in the nanoscale domain to directly observe the interface characteristics, microstructural morphology, and evolution process of ferrite and martensite phases. These observations are crucial steps toward deepening the understanding of the relationship between phase transformation kinetics, microstructural organization, and mechanical properties of ferrite-martens steel.

What is a metal fracture? When a metal breaks under external forces, it leaves behind two matching surfaces called "fracture surfaces" or "fracture faces." The shape and appearance of these surfaces contain important information about the fracture process.   By observing and studying the morphology of the fracture surface, we can analyze the causes, properties, modes, and mechanisms of the fracture. It also provides insights into the stress conditions and crack propagation rates during the fracture. Similar to an "on-site" investigation, the fracture surface preserves the entire process of fracture. Therefore, examining and analyzing the fracture surface is a crucial step and method in studying metal fractures. Scanning electron microscope, with its large depth of field and high resolution, has been widely used in the field of fracture analysis.   The application of scanning electron microscope in metal fracture analysis   Metal fractures can occur in various failure modes. Based on the deformation level before fracture, they can be classified as brittle fracture, ductile fracture, or a mixture of both. Different fracture modes exhibit characteristic microscopic morphologies, and CIQTEK scanning electron microscope characterization can help researchers quickly analyze fracture surfaces.   Ductile fracture   Ductile fracture refers to the fracture that occurs after a significant amount of deformation in the component, and its main feature is the occurrence of obvious macroscopic plastic deformation. The macroscopic appearance is cup-cone or shear with a fibrous fracture surface, characterized by dimples. As shown in Figure 1, at the microscale, the fracture surface consists of small cup-shaped micropores called dimples. Dimples are microvoids formed by localized plastic deformation in the material. They nucleate, grow, and coalesce, eventually leading to fracture, and leaving traces on the fracture surface.   Figure 1: Ductile fracture surface of metal / 10kV / Inlens   Brittle fracture   Brittle fracture refers to the fracture that occurs without significant plastic deformation in the component. The material undergoes little or no plastic deformation before fracture. Macroscopically, it appears crystalline, and microscopically, it can exhibit intergranular fracture, cleavage fracture, or quasi-cleavage fracture. As shown in Figure 2, it is a mixed brittle-ductile fracture surface of metal. In the ductile fracture region, noticeable dimples can be observed. In the brittle fracture region, intergranular brittle fracture occurs along different crystallographic orientations. At the microscale, the fracture surface exhibits multiple facets of the grains, with clear grain boundaries and a three-dimensional appearance. Smooth and featureless morphology is often observed on the grain boundaries. When the grains are coarse, the fracture surface appears crystalline, also known as a crystalline fracture; when the...

Abstract: Titanium dioxide, widely known as titanium white, is an important white inorganic pigment extensively used in various industries such as coatings, plastics, rubber, papermaking, inks, and fibers. Studies have shown that the physical and chemical properties of titanium dioxide, such as photocatalytic performance, hiding power, and dispersibility, are closely related to its specific surface area and pore structure.   Using static gas adsorption techniques for precise characterization of parameters like specific surface area and pore size distribution of titanium dioxide can be employed to evaluate its quality and optimize its performance in specific applications, thereby further enhancing its effectiveness in various fields.   About Titanium Dioxide: Titanium dioxide is a vital white inorganic pigment primarily composed of titanium dioxide. Parameters such as color, particle size, specific surface area, dispersibility, and weather resistance determine the performance of titanium dioxide in different applications, with specific surface area being one of the key parameters. Specific surface area and pore size characterization help understand the dispersibility of titanium dioxide, thereby optimizing its performance in applications such as coatings and plastics. Titanium dioxide with a high specific surface area typically exhibits stronger hiding power and tinting strength.   In addition, research has indicated that when titanium dioxide is used as catalyst support, a larger pore size can enhance the dispersion of active components and improve the overall catalytic activity, while a smaller pore size increases the density of active sites, aiding in improving reaction efficiency. Hence, by regulating the pore structure of titanium dioxide, its performance as a catalyst support can be improved.   In summary, the characterization of specific surface area and pore size distribution not only aids in evaluating and optimizing the performance of titanium dioxide in various applications but also serves as an important means of quality control in the production process. Precise characterization of titanium dioxide enables a better understanding and utilization of its unique properties to meet the requirements in different application fields.   Application Examples of Gas Adsorption Techniques in Titanium Dioxide Characterization:   1. Characterization of Specific Surface Area and Pore Size Distribution of Titanium Dioxide for DeNOx Catalysts   Selective catalytic reduction (SCR) is one of the commonly applied and researched flue gas denitrification technologies. Catalysts play a crucial role in SCR technology, as their performance directly affects the efficiency of nitrogen oxide removal. Titanium dioxide serves as the carrier material for DeNOx catalysts, primarily providing mechanical support and erosion resistance to active components and catalytic additives, along with increasing the reaction surface area and pr...

Molecular sieves are artificially synthesized hydrated aluminosilicates or natural zeolites with molecular sieving properties. They have uniformly sized pores and well-arranged channels and cavities in their structure. Molecular sieves of different pore sizes can separate molecules of different sizes and shapes. They possess functions such as adsorption, catalysis, and ion exchange, which give them tremendous potential applications in various fields such as petrochemical engineering, environmental protection, biomedical, and energy.   In 1925, the molecular separation effect of zeolite was first reported, and zeolite acquired a new name — molecular sieve. However, the small pore size of zeolite molecular sieves limited their application range, so researchers turned their attention to the development of mesoporous materials with larger pore sizes. Mesoporous materials (a class of porous materials with pore sizes ranging from 2 to 50 nm) have extremely high surface area, regularly ordered pore structures, and continuously adjustable pore sizes. Since their inception, mesoporous materials have become one of the interdisciplinary frontiers.   For molecular sieves, particle size and particle size distribution are important physical parameters that directly affect product process performance and utility, particularly in catalyst research. The crystal grain size, pore structure, and preparation conditions of molecular sieves have significant effects on catalyst performance. Therefore, exploring changes in molecular sieve crystal morphology, precise control of their shape, and regulating and enhancing catalytic performance are of great significance and have always been important aspects of molecular sieve research. Scanning electron microscopy provides important microscopic information for studying the structure-performance relationship of molecular sieves, aiding in guiding the synthesis optimization and performance control of molecular sieves.   ZSM-5 molecular sieve has an MFI structure. The product selectivity, reactivity and stability of MFI-type molecular sieve catalysts with different crystal morphologies may vary depending on the morphology.   Figure 1(a) MFI skeleton topology   The following are images of ZSM-5 molecular sieve captured using the CIQTEK High-Resolution Field Emission Scanning Electron Microscope SEM5000X.   Figure 1(b) ZSM-5 molecular sieve/500V/Inlens SBA-15 is a common silicon-based mesoporous material with a two-dimensional hexagonal pore structure, with pore sizes typically ranging from 3 to 10 nm. Most mesoporous materials are non-conductive, and the commonly used pre-treatment method of coating (with Pt or Au) may block the nanoscale pores, affecting the characterization of their microstructure.   Therefore, such samples are usually not subjected to any coating pre-treatment, which requires the scanning electron microscope to have ultra-high resolution imaging capability even at extr...

Porous adsorbents play an important role in the fields of environmental purification, energy storage and catalytic conversion due to their unique porous structure and properties. Porous adsorbents usually have high specific surface area and rich pore distribution, which can effectively interact with molecules in gas or liquid. Using static gas adsorption method to accurately characterize parameters such as BET and Pore Distribution, can help to gain a deeper understanding of the properties and adsorption performance of porous adsorbents.   BET and Pore Distribution of porous adsorbents   Porous adsorbents are a type of material with high specific surface area and rich pore structure, which can capture and fix molecules in gas or liquid through physical or chemical adsorption. There are many types of them, including inorganic porous adsorbents (activated carbon, silica gel, etc.), organic Polymer adsorbents (ion exchange resins, etc.), coordination polymers (MOFs, etc.) and composite porous adsorbents, etc.   A thorough understanding of the physical properties of porous adsorbents is critical to optimizing performance and expanding application areas. The application directions of BET Surface Area & Porosimetry Analyzer in the porous adsorbent industry mainly include quality control, research and development of new materials, optimization of separation processes, etc. By accurately testing the specific surface area and pore distribution, the performance of porous adsorbents can be improved in a targeted manner to meet specific application needs and improve the selective adsorption of target molecules.   In summary, analyzing the specific surface area and pore distribution of porous adsorbents through gas adsorption characterization is beneficial to evaluate the adsorption capacity, selectivity and efficiency, and is of great significance in promoting the development of new high-efficiency adsorbents.   Characterization of gas adsorption properties of MOFs materials   Metal-organic framework materials (MOFs) have become a new type of adsorption material that has attracted much attention due to its high porosity, large specific surface area, adjustable structure and easy functionalization. Through the synergistic regulation of functional group modification and pore size adjustment, the CO2 capture and separation performance of MOFs materials can be improved to a certain extent.   UiO-66 is a widely used MOFs adsorbent, often used in gas adsorption, catalytic reactions, molecular separation and other fields. The following is a case of characterization of UiO-66 material using the CIQTEK V-3220&3210 BET Surface Area & Porosimetry Analyzer.   As shown on the left side of Figure 1, the specific surface area of UiO-66 is 1253.41 m2/g. A high specific surface area can provide more active sites, which is beneficial to improving its adsorption performance. It can be seen from t...

Scanning electron microscope as a commonly used microscopic analysis tools, can be observed on all types of metal fracture, fracture type determination, morphology analysis, failure analysis and other research.   What is a metal fracture?   When a metal is broken by an external force, two matching sections are left at the fracture site, which is called a "fracture". The shape and appearance of this fracture contains a lot of important information about the fracture process.   By observing and studying the morphology of the fracture, we can analyze the cause, nature, mode, mechanism, etc., and also understand the details of the stress condition and crack expansion rate at the time of fracture. Like a "scene", the fracture retains the whole process of fracture occurrence. Therefore, for the study of metal fracture problems, observation and analysis of fracture is a very important step and means. Scanning electron microscope has the advantages of large depth of field and high resolution, and has been widely used in the field of fracture analysis.   Application of Scanning Electron Microscope in Metal Fracture Analysis   There are various forms of failure of metal fracture. Categorized by the degree of deformation before fracture, they can be divided into brittle fracture, ductile fracture, and mixed brittle and ductile fracture. Different fracture forms will have characteristic microscopic morphology, which can be characterized by SEM to help researchers to quickly perform fracture analysis.   Ductile Fracture   Ductile fracture is a fracture that occurs after a large amount of deformation of a member, which is mainly characterized by significant macroplastic deformation. The macroscopic morphology is a cup-and-cone fracture or a pure shear fracture, and the fracture surface is fibrous and consists of tough nests. As shown in Figure 1, microscopically its fracture is characterized by: the fracture surface consists of a number of tiny wineglass-shaped microporous pits, usually referred to as tough fossa. Toughness fossa is the trace left on the fracture surface after plastic deformation of the material in the range of micro-region generated by the micro-void, through the nucleation/growth/aggregation, and finally interconnected to lead to fracture.     Fig. 1 Metal ductile fracture fracture/10kV/Inlens   Brittle Fracture   Brittle fracture is the fracture of a member without significant deformation. There is little plastic deformation of the material at the time of fracture. While macroscopically it is crystalline, microscopically it includes fracture along the crystal, disintegration fracture or quasi-disintegration fracture. As shown in Fig. 2, a mixed brittle-ductile fracture fracture of the metal, in the ductile fracture region, a distinctive toughness nest feature can be observed. In the brittle fracture region, it belongs to along-crystalline brittle fracture, which refers to the fract...