FESEM | SEM5000Pro suppliers,FESEM | SEM5000Pro manufacturers,FESEM

Low Voltage High Resolution
High Stability
In-lens Electron Detector

*Specimen Exchange Loadlock (8 inches compatible)
Electromagnetic Beam Deflection with Multi-hole Apertursofte
Excellent Expandability

▶ Electron Optics

★ "Super Tunnel" electron optics column technology/in-lens beam deceleration
Decrease spatial charging effect, ensuring low voltage resolution.

★ Crossover-free in the electron beam path
Effectively reduce lens aberrations and improve resolution.

★ Electromagnetic & electrostatic compound objective lens
Reduce aberrations, significantly improve resolution at low voltages, and enable observation of magnetic samples.

★ Water-cooled constant-temperature objective lens
Ensure the stability, reliability, and repeatability of the objective lens operation.

★ Variable multi-hole aperture with electromagnetic beam deflection system
Automatic switching between apertures without mechanical motion, allowing fast switching between imaging modes.

▶ BSED-based ECCI mode (Electron Channeling Contrast Imaging)

The "Electron Channeling effect" refers to a significant reduction in electron scattering by crystal lattices, when the incident electron beam satisfies the Bragg diffraction condition, allowing a large number of electrons to pass through the lattice, thus exhibiting a "channeling" effect.

For polycrystalline materials with uniform composition and polished flat surfaces, the intensity of backscattered electrons relies on the relative orientation between the incident electron beam and crystal planes. Grains with larger orientation variation exhibit stronger signals therefore brighter images, qualitative characterization with such grain orientation map is achieved.

3D-printed Alloys (prepared with ion beam polishing)
Stainless Steel (prepared with ion beam polishing)

▶ Simultaneously Multi-channel Imaging via Various Detectors

A great resolution was achieved on surface topographic features with in-lens electron detector imaging
Good stereoscopic images of morphological features with Everhart-Thornley detector imaging
Atomic number contrast (Z-contrast) image with retractable back-scattered electron detector imaging

▶ Retractable Scanning Transmission Electron Microscopy (STEM) Detector

>> Multiple Operating Modes: Bright-field (BF) imaging, Dark-field (DF) imaging, High-angle annular dark-field (HAADF) imaging

Plant section bright-field imaging (STEM-BF)
Plant section dark-field imaging (STEM-DF)
Atomic number contrast (Z-contrast) image with retractable back-scattered electron detector

▶ Advances in CIQTEK Electron Microscopy - More Options

>> Energy Dispersive Spectrometry

>> Catholuminescence

>> EBSD

CIQTEK FESEM Microscope SEM5000Pro Image Gallery

>> Materials Science - Nanomaterials

Non-conductive two-dimensional material C3N4, non-destructive characterization of its fine layer structure under low-voltage conditions at 500 V
Imaging of nickel foam with strong three-dimensional effect using a 2 kV excitation voltage with Everhart-Thornley Detector (ETD)
Imaging of sub-nanometer silver powder using an in-lens electron detector at 3 kV under high-vacuum conditions

>> Materials Science - Energy Materials

Lithium-ion Battery Cathode Precursor - Iron Phosphate with poor conductivity, imaged using an In-lens Electron Detector (In-lens) under low voltage (1 kV) conditions
The surface metallization quality of photovoltaic silicon wafers, imaged using a Chamber-mounted Everhart-Thornley Detector (ETD) at 2 kV
Surface SEI (Solid Electrolyte Interphase) film on the failed negative electrode, imaged under high vacuum conditions using an In-lens Electron Detector (In-lens) at 3 kV

>> Materials Science - Polymer Materials and Metal Materials

Using Everhart-Thornley Detector (ETD) under high vacuum and low voltage conditions (1 kV) for imaging the morphology of polystyrene microspheres. No charging phenomenon was observed, resulting in a strong three-dimensional perception
Non-destructive 500 V imaging of lithium-ion battery polymer membrane fibers under the surface-sensitive condition
$sem image analysis High-resolution imaging of nano-sized precipitates in fracture surfaces using the Retractable Back-Scattered Electron Detector(BSED)$
High-resolution imaging of nano-sized precipitates in fracture surfaces using the Retractable Back-Scattered Electron Detector (BSED)

>> Magnetic Materials - Polymer materials and metal materials

Polymer magnetic beads, with poor conductivity, characterized using a low-voltage at 2 kV with Everhart-Thornley Detector (ETD) for the characterization of biologically targeted drug delivery
$sem image analysis 10 kV imaging with Everhart-Thornley Detector (ETD) used to characterize the fracture surface of iron-nickel alloy metal.$
10 kV imaging with Everhart-Thornley Detector (ETD) was used to characterize the fracture surface of iron-nickel alloy metal
Polymer magnetic beads, characterized using a low-voltage 2 kV with Everhart-Thornley Detector (ETD), exhibit a strong sense of three-dimensionality

>> Semiconductor Materials

Imaging of the surface patterns and circuits on a chip using a Retractable Back-Scattered Electron Detector (BSED)
Low voltage (2 kV) Everhar t-Thornley Detector (ETD) characterization of the surface and hole edge textures of a photoresist
Imaging of the solder joints of gold wires on a chip using a Retractable Back-Scattered Electron Detector(BSED). Sample prepared with ion beam polishing

>> Life Science

Characterization of iridophores in lizard skin cells, using the STEM detector in the CIQTEK SEM5000Pro FE-SEM.

Animal colors in nature can be classified into two categories based on their formation mechanisms: pigment colors and structural colors.
Pigment colors are achieved through variations in pigment composition and the overlapping of colors, similar to the principles of "primary colors."
Structural colors, on the other hand, are generated through the reflection of light of different wavelengths by intricate physiological structures, based primarily on principles of optics. Iridophores, found in lizard skin cells, possess structures similar to diffraction gratings. We refer to these structures as "crystalline plates." Crystalline plates can reflect and scatter light of different wavelengths. Studies have shown that by varying the size, spacing, and angle of the crystalline plates in lizard iridophores, the wavelengths of light scattered and reflected by their skin can be altered. This finding is significant for understanding the mechanisms behind color change in lizard skin.

▶ Particle & Pore Analysis Software (Particle) *Optional

SEM Particle & Pore Analysis Software (Particle)

The CIQTEK SEM Microscope software employs various target detection and segmentation algorithms, suitable for different types of particle and pore samples. it enables quantitative analysis of particle and pore statistics and can be applied in fields such as materials science, geology, and environmental science.

▶ Image Post-processing Software *Optional

SEM Microscope Image Post-processing Software

Perform online or offline image post-processing on images captured by electron microscopes and integrate commonly used EM image processing functions, convenient measurement, and annotation tools.

▶ Auto Measure *Optional

Automatic recognition of line width edges, resulting in more accurate measurements and higher consistency. Support multiple edge detection modes, such as Line, Space, Pitch, etc. Compatible with multiple image formats and equipped with various commonly used image post-processing functions. The software is easy to use, efficient, and accurate.

▶ Software Development Kit (SDK) *Optional

SEM Microscope Software Development Kit (SDK)

Provide a set of interfaces for controlling the SEM microscope, including image acquisition, operating condition settings, power on/off, stage control, etc. Concise interface definitions allow for the rapid development of specific electron microscope operation scripts and software, enabling automated tracking of regions of interest, industrial automation data acquisition, image drift correction, and other functions. Can be used for software development in specialized areas such as diatom analysis, steel impurity inspection, cleanliness analysis, raw material control, etc.

▶ AutoMap *Optional

CIQTEK FESEM Microscope SEM5000Pro Specifications
Electron Optics	Resolution	0.8 nm @ 15 kV, SE 1.2 nm @ 1.0 kV, SE
	Acceleration Voltage	0.02kV ~ 30 kV
	Magnificationn (Polaroid)	1 ~ 2,500,000 x
	Electron Gun Type	Schottky Field Emission Electron Gun
Specimen Chamber	Camera	Dual Cameras (Optical navigation + chamber monitor)
	Camera	Dual Cameras (Optical navigation + chamber monitor)
	Stage Range	X: 110 mm, Y: 110 mm, Z: 50 mm T: -10°～ +70°, R: 360°
SEM Detectors and Extensions	Standard	Inlens Electron Detector Everhart-Thornley Detector (ETD)
SEM Detectors and Extensions	Optional	Retractable Backscattered Electron Detector (BSED) Retractable Scanning Transmission Electron Microscope(STEM) Low Vacuum Detector（LVD） Energy Dispersive Spectroscopy (EDS / EDX) Electron Backscatter Diffraction Pattern (EBSD) Specimen Exchange Loadlock （4 inch /8 inch) Trackball & Knob Control Panel
Software	Language	English
	Operating System	Windows
	Navigation	Optical Navigation, Gesture Quick Navigation, Trackball (optional)
	Automatic Functions	Auto Brightness & Contrast, Auto Focus, Auto Stigmator

Hot Tags : field emission scanning electron microscope fe sem sem eds edx field emission scanning electron microscope price fesem and sem microscope fe sem analysis fe sem image feg sem fesem instrument

Leave A Message

Please feel free to contact us for more details, request a quote or book an online demo! We will reply you as soon as we can.

Subject : FESEM | SEM5000Pro