CIQTEK Hosts SEM Microscopes Advanced Operational Training Program for GSEM KOREA
CIQTEK Hosts SEM Microscopes Advanced Operational Training Program for GSEM KOREA
August 15, 2024
CIQTEK, a leading provider of advanced scientific instruments, announces the successful completion of a comprehensive training program focused on the operation and application of cutting-edge Scanning Electron Microscope (SEM)series with GSEM KOREA. The training took place at CIQTEK Application Center from August 7th to 8th and aimed to enhance agent's expertise in high-resolution imaging for various scientific disciplines, providing valuable insights into the advanced features and functionalities.
The program featured a team of experienced trainers and technical experts from CIQTEK, who guided attendees through the intricacies of SEM operations. Participants gained insights into sample preparation techniques, imaging parameters optimization, and data analysis methodologies to obtain high-quality images and extract valuable information from the samples with precision.
Dr. Lisa, Senior Applications Scientist at CIQTEK, expressed her enthusiasm for the successful collaboration with GSEM KOREA, stating, "We are thrilled to have partnered with GSEM KOREA to deliver this comprehensive training program. And through this training, we aimed to equip researchers with the necessary skills to leverage these instruments effectively."
CIQTEK is committed to promoting scientific advancements and empowering researchers with cutting-edge technologies. By organizing training programs and partnering with leading companies like GSEM KOREA, CIQTEK continues to facilitate knowledge exchange and foster innovation in scientific research.
Analytical field emission scanning electron microscope (FESEM) equipped with a high-brightness long-life Schottky field emission electron gun With the three-stage condenser electron optics column design for beam currents up to 200 nA, SEM4000Pro delivers advantages in EDS, EBSD, WDS, and other analytical applications. The system supports low vacuum mode as well as a high-performance low-vacuum secondary electron detector and retractable backscattered electron detector, which can help directly observe poorly conductive or even non-conductive samples. Standard optical navigation mode and an intuitive user operation interface make your analysis work easy.
High-performance tungsten filament SEM microscope with excellent imaging quality capabilities in both high and low vacuum modes The CIQTEK SEM3200 SEM Microscope has a large depth of field with a user-friendly interface to enable users to characterize specimens and explore the world of microscopic imaging and analysis.
Ultra-high resolution Field Emission Scanning Electron Microscopy (FESEM): 0.6 nm@15 kV and 1.0 nm@1 kV The CIQTEK SEM5000X ultra-high resolution FESEM utilizes the upgraded column engineering process, “SuperTunnel” technology, and high-resolution objective lens design to improve low-voltage imaging resolution. The FESEM SEM5000X specimen chamber ports extend to 16, and the specimen exchange load-lock supports up to 8-inch wafer size (maximum diameter 208 mm), significantly expanding the applications. The advanced scanning modes and enhanced automated functions bring stronger performance and an even more optimized experience.